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Defect distribution in Fe - doped InP epitaxial layers
Title statement Defect distribution in Fe - doped InP epitaxial layers / aut. Arpád Kósa, Jakub Drobný, Jaroslav jr Kováč, M Badura, Beata Sciana, Ľubica Stuchlíková Main entry-name Kósa, Arpád, 1987- (Author) - FEI Ústav elektroniky a fotoniky Another responsib. Drobný, Jakub, 1994- Z3 (Author) - FEI Ústav elektroniky a fotoniky Kováč, Jaroslav jr. 1977- Z1 (Author) - FEI Ústav elektroniky a fotoniky Badura, M. (Author) Sciana, Beata (Author) Stuchlíková, Ľubica, 1967- Z1 (Author) - FEI Ústav elektroniky a fotoniky In ADEPT 2019 [295 s.] / International conference on Advances in electronic and photonic technologies (Adept 2019). -- Žilina : University of Žilina, 2019. -- ISBN 978-80-554-1568-0. -- S. 175-178 Subj. Headings Fe doped InP defect Deep Level Transient Fourier Spectroscopy Language English Document kind RZB - článok zo zborníka Category AFD - Reports at home scientific conferences Category (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Year 2019 
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Number of the records: 1