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- Investigation of the Interface between Laser-Melted CoCr and a Stainless Steel Substrate
Cosma Cosmin Teusan Christina Gogola Peter ; 061000 Simion Mihaela Gabalcová Zuzana ; 061000 Trif Adrian Berce Petru Balc Nicolae
Metals . Vol. 12, iss. 6 (2022), s. 1-16
selective laser melting CoCr adhesion strength microhardness X-ray computed tomography Scanning electron microscopy
https://www.mdpi.com/2075-4701/12/6/965
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- Analysis of the properties of electron beam welded joints of aluminium lithium alloy latest generation / aut. Miroslav Sahul, Martin Sahul, Ľubomír Čaplovič, Milan Marônek, Illia Klochkov, Sviatoslav Motrunich
Sahul Miroslav ; 063700 Sahul Martin ; 061000 Čaplovič Ľubomír ; 061000 Marônek Milan ; 063100 Klochkov Illia Motrunich Sviatoslav
The Paton Welding Journal . No. 5 (2021), s. 46-50
AW2099 aluminium lithium alloy electron beam welding equiaxed zone scanning electron microscopy drop of microhardness
https://patonpublishinghouse.com/eng/journals/tpwj/2021/05/07
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- Identification of electrically stressed regions in AlGaN/GaN-on-Si Schottky barrier diode using EBIC technique / aut. Juraj Priesol, Alexander Šatka, Aleš Chvála, Steve Stoffels, Brice De Jaeger, Stefaan Decoutere
Priesol Juraj ; 033000 Šatka Alexander ; 033000 Chvála Aleš ; 033000 Stoffels Steve De Jaeger Brice Decoutere Stefaan
IEEE Transactions on Electron Devices . Vol. 68, No. 1 (2021), s. 216-221
AlGaN/GaN electric field electrical stress EBIC Focused Ion Beam Scanning electron microscopy Schottky diode TCAD simulation
https://ieeexplore.ieee.org/document/9288930
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- Raman spectroscopy of porous silicon substrates / aut. Magdaléna Kadlečíková, Juraj Breza, Ľubomír Vančo, Miroslav Mikolášek, Michal Hubeňák, Juraj Racko, Ján Greguš
Kadlečíková Magdaléna ; 033000 Breza Juraj ; 033000 Vančo Ľubomír ; 902640 Mikolášek Miroslav ; 033000 Hubeňák Michal Racko Juraj ; 033000 Greguš Ján
Optik . Vol. 174, (2018), s. 347-353
porous silicon Raman spectroscopy Scanning electron microscopy SEM
https://www.sciencedirect.com/science/article/pii/S0030402618312336
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- Surface and electrochemical characterization of boron-doped diamond electrodes prepared under different conditions / aut. Renáta Šelešovská, Michaela Štěpánková, Lenka Janíková, Kateřina Nováková, Marian Vojs, Marián Marton, Miroslav Behúl
Šelešovská Renáta Štěpánková Michaela Janíková Lenka Nováková Kateřina Vojs Marian ; 033000 Marton Marián ; 033000 Behúl Miroslav ; 033000
Monatshefte für Chemie - Chemical Monthly . Vol. 147, Iss. 8 (2016), s. 1353-1364
boron-doped diamond electrode Scanning electron microscopy Raman spectroscopy Voltammetry Electrochemical Impedance Spectroscopy Linuron
http://link.springer.com/article/10.1007/s00706-015-1640-3
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- Evaluation of structural isotropy of Cr-V ledeburitic steel made by powder metallurgy of rapidly solidified particles / aut. Matej Nemec, Peter Jurči, Petra Kosnáčová, Marta Kučerová
Nemec Matej ; 061000 Jurči Peter ; 061000 Kosnáčová Petra Kučerová Marta ; 064000
Kovové materiály. Metallic materials / . Vol. 54, iss. 6 (2016), s. 453-462
isotropy of material electron microscopy Scanning electron microscopy
http://www.kovmat.sav.sk/abstract.php?rr=54&cc=6&ss=453
http://apps.webofknowledge.com/InboundService.do?SID=V1F3JCQo2heGLheqXeU&locale=en&action=retrieve&product=CCC&mode=FullRecord&viewType=fullRecord&UT=000390642600007&srcDesc=RET2TOC&returnLink=http%3A//toc.webofknowledge.com%3FSID%3DV1F3JCQo2heGLheqXeU%26sq%3D1%26locale%3Den%26recid%3D%26instid%3DKOVOVE%2BMATERIALY%2BMETALLIC%2BMATERIALS%26journal%3D2016,Vol.54,Iss.6%26issue_qid%3D1/1%26Func%3DBrowseToC
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- Isothermal Section of the Al-Pd-Co Phase Diagram at 850 A degrees C Delimited by Homogeneity Ranges of Phases Epsilon, U, and F / aut. Ivona Černičková, Libor Ďuriška, Pavol Priputen, Dušan Janičkovič, Jozef Janovec
Černičková Ivona ; 061000 Ďuriška Libor ; 061000 Priputen Pavol ; 061000 Janičkovič Dušan Janovec Jozef ; 902680
Journal of Phase Equilibria and Diffusion . Vol. 37, iss. 3 (2016), s. 301-307
Aluminium alloys intermetallics electron microscopy scanning electron microscopy
http://download.springer.com/static/pdf/291/art%253A10.1007%252Fs11669-016-0456-0.pdf?originUrl=http%3A%2F%2Flink.springer.com%2Farticle%2F10.1007%2Fs11669-016-0456-0&token2=exp=1465547513~acl=%2Fstatic%2Fpdf%2F291%2Fart%25253A10.1007%25252Fs11669-016-0456-0.pdf%3ForiginUrl%3Dhttp%253A%252F%252Flink.springer.com%252Farticle%252F10.1007%252Fs11669-016-0456-0*~hmac=0ad9a361e6a650fe5192a0fdad9539138e1398906d3dd54fb57979edd989aa25
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- Aplikácia metódy Monte Carlo v rastrovacej elektrónovej mikroskopii GaN štruktúr : dát. obhaj. 20.3.2014, č. ved. odb. 5-2-13
Priesol Juraj ; E030 Šatka Alexander (Thesis advisor) ; E030
Bratislava : STU v Bratislave FEI, 2014 . - 97 s AUTOREF. 2014, 28 s.
Mikroelektronika Microelectronics Scanning electron microscopy GaN
http://is.stuba.sk/zp/portal_zp.pl?podrobnosti=81827
dizertačná práca
DAI - Qualificational works (thesis, habilitation, atestation...)Faculty Available Inaccesible Issued For Request Only FEI 1 0 0 0 
book
- Vývoj metodiky štandardizácie heterogénnych vzoriek pomocou energiovo a vlnovo disperznej analýzy
Bíró Róbert Nosko Martin (Thesis advisor)
Trnava : STU v Bratislave MTF UMAT, 2013
MTF ;
Materials Engineering Scanning electron microscopy
http://is.stuba.sk/zp/portal_zp.pl?podrobnosti=79553
diplomová prácaFaculty Available Inaccesible Issued For Request Only MTF 0 0 0 1 book
- Application of the van't Hoff dependences in the characterization of molecularly imprinted polymers for some phenolic acids
Denderz Natalia ; C1180 Lehotay Jozef
Journal of Chromatography A . Vol. 1268 (2012), s.44-52
molecularly imprinted polymers Thermodynamic analysis Phenolic acids Attenuated total reflectance analysis Fourier transform infrared spectroscopy Scanning electron microscopy
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