Machine Learning and Data Mining in Pattern Recognition : Part II, proceedings of the 14th International Conference MLDM 2018. New York, NY, USA, July 15-19, 2018 [elektronický dokument] / ed. Petra Perner
Perner, Petra (Editor)
International Conference Machine Learning and Data Mining in Pattern Recognition 14th 15. - 19. 7. 2018 New York, NY, USA
1. vyd.
Cham : Springer, 2018 . - USB kľúč, 482 s.,
ISBN 978-3-319-96133-0. -- ISBN 978-3-319-96132-3 (print)
zborník (príspevkov)
(1) - článok