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1.Thin Film Analysis by X-Ray Scattering

Thin Film Analysis by X-Ray Scattering / aut. Mario Birkholz
Birkholz Mario
Weinheim : Wiley-Vch, 2006 . - 356 s.
ISBN 978-3-527-31052-4
tenké vrstvy spektroskopia röntgenová spektroskopia
monografia

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