Electronic structure of UV degradation defects in polysilanes studied by Energy Resolved – Electrochemical Impedance Spectroscopy / aut. František Schauer, Miroslava Tkáčová, Vojtech Nádaždy, Katarína Gmucová, Miroslava Ožvoldová, L Tkáč, Juraj Chlpík
Schauer František  Tkáčová Miroslava Nádaždy Vojtech Gmucová Katarína Ožvoldová Miroslava Tkáč Lukáš Chlpík Juraj ; 036000
Polymer Degradation and Stability . Vol. 126, (2016), s. 204-208
polysilanes poly[methyl(phenyl)silylene UV degradation photochemical scission crosslinking defects bridging defects Electrochemical Impedance Spectroscopy
http://www.sciencedirect.com/science/article/pii/S0141391016300398
článok z periodika
ADC - Scientific titles in foreign carented magazines and noticed year-books
V3 - Vedecký výstup publikačnej činnosti z časopisu