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  1. Application of IDDT Test in SRAM Arrays Towards Detection of Weak Opens : dát. obhaj. 24.6.2014, č. ved. odb. 26-13-9
    Gyepes Gábor ; E030  Stopjaková Viera (Thesis advisor) ; E030
    Bratislava : STU v Bratislave FEI, 2014
    FEI ; 24.06.2014 ; 99 . - 98 s AUTOREF. 2014, 36 s.
    Mikroelektronika Microelectronics
    http://is.stuba.sk/zp/portal_zp.pl?podrobnosti=113990
    dizertačná práca
    DAI - Qualificational works (thesis, habilitation, atestation...)
    Faculty Available Inaccesible Issued For Request Only
    FEI1000
    book

    book


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