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Thin Film Analysis by X-Ray Scattering
Title statement Thin Film Analysis by X-Ray Scattering / aut. Mario Birkholz Main entry-name Birkholz, Mario (Author) Issue data Weinheim : Wiley-Vch, 2006 Phys.des. 356 s. ISBN 978-3-527-31052-4 Subj. Headings tenké vrstvy spektroskopia röntgenová spektroskopia UDC 53.01 Country Germany Language English Document kind AMG - monografia 
book
Barcode Call number of location Call number Location Sublocation Info 284EK89510 E* 89510 Fakulta elektrotechniky a informatiky Ústav jadrového a fyzikálného inžinierstva In-Library Use Only 284M088491 M* 14394-1 Materiálovotechnická fakulta M KN borrowed (until *02.01.2024)
Number of the records: 1