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The effect of process parameters and annealing on the properties of Ti/Pt films for miniature temperature sensors
CREPC201701 CREPC201702 CREPC201703 CREPC201706 Title statement The effect of process parameters and annealing on the properties of Ti/Pt films for miniature temperature sensors / aut. Ivan Hotový, Štefan Haščík, Martin Predanocy, Miroslav Mikolášek, Vlastimil Řeháček, Ivan Kostič, Pavol Nemec, Anna Benčurová, Diana Rossberg, Lothar Spiess Main entry-name Hotový, Ivan, 1957- (Author) - FEI Ústav elektroniky a fotoniky Another responsib. Haščík, Štefan Z5 (Author) Predanocy, Martin, 1984- Z2 (Author) - FEI Ústav elektroniky a fotoniky Mikolášek, Miroslav, 1983- Z2 (Author) - FEI Ústav elektroniky a fotoniky Řeháček, Vlastimil, 1957- Z2 (Author) - FEI Ústav elektroniky a fotoniky Kostič, Ivan (Author) Nemec, Pavol (Author) Benčurová, Anna Z5 (Author) Rossberg, Diana (Author) Spiess, Lothar (Author) In ASDAM 2016 / International conference on advanced semiconductor devices and microsystems. -- Danvers : IEEE, 2016. -- ISBN 978-1-5090-3081-1. -- S. 85-88 Language English URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7805901 Document kind RZB - článok zo zborníka Category AFD - Reports at home scientific conferences Category (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka WOS: 000392530900021
SCOPUS: 2-s2.0-85011015595Year 2016 article
Number of the records: 1