Number of the records: 1  

Design and test technology for dependable systems-on-chip

  1. Title statementDesign and test technology for dependable systems-on-chip / ed. Raimund Ubar ; ed. Jaann Raik, Theodor Heinrich Vierhaus
    Main entry-name Ubar, Raimund (Editor)
    Another responsib. Raik, Jaann (Editor)
    Vierhaus, Theodor Heinrich (Editor)
    Edition statement1. vyd.
    Issue dataHershey IGI Global 2011
    Phys.des.550 s.
    ISBN978-1-60960-212-3
    CountryUnited States
    LanguageEnglish
    Document kindAMG - monografia
    Year2011
    References (2) - článok
    book

    book

    BarcodeCall number of locationCall numberLocationSublocationInfo
    284IK06892I* 2C14021Fakulta informatiky a informačných technológií

Number of the records: 1  

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