- Investigation of volume fraction of GaP nanowires by SEM characteriza…
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Investigation of volume fraction of GaP nanowires by SEM characterization and spectroscopic ellipsometry

  1. Title statementInvestigation of volume fraction of GaP nanowires by SEM characterization and spectroscopic ellipsometry / aut. Jaroslava Škriniarová, Pavol Hronec, Juraj Chlpík, Agáta Laurenčíková, Jaroslav jr Kováč, Jozef Novák, Robert Andok
    Main entry-name Škriniarová, Jaroslava, 1954- (Author) - FEI Ústav elektroniky a fotoniky
    Another responsib. Hronec, Pavol, 1987- (Author)
    Chlpík, Juraj, 1975- Z1 (Author) - FEI Ústav jadrového a fyzikálneho inžinierstva
    Laurenčíková, Agáta Z5 (Author)
    Kováč, Jaroslav jr. 1977- Z1 (Author) - FEI Ústav elektroniky a fotoniky
    Novák, Jozef, 1951 Z5 (Author)
    Andok, Robert Z5 (Author)
    In Optik. -- ISSN 0030-4026. -- Vol. 234, (2021), art. no. 166572 [6] s.
    Subj. Headings ellipsometry
    GaP
    SEM
    Nanowires
    LanguageEnglish
    Document kindRBX - článok z periodika
    CategoryADC - Scientific titles in foreign carented magazines and noticed year-books
    Category (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    In databases
    Year2021
    article

    article

Number of the records: 1  

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