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Investigation of volume fraction of GaP nanowires by SEM characterization and spectroscopic ellipsometry
Title statement Investigation of volume fraction of GaP nanowires by SEM characterization and spectroscopic ellipsometry / aut. Jaroslava Škriniarová, Pavol Hronec, Juraj Chlpík, Agáta Laurenčíková, Jaroslav jr Kováč, Jozef Novák, Robert Andok Main entry-name Škriniarová, Jaroslava, 1954- (Author) - FEI Ústav elektroniky a fotoniky Another responsib. Hronec, Pavol, 1987- (Author) Chlpík, Juraj, 1975- Z1 (Author) - FEI Ústav jadrového a fyzikálneho inžinierstva Laurenčíková, Agáta Z5 (Author) Kováč, Jaroslav jr. 1977- Z1 (Author) - FEI Ústav elektroniky a fotoniky Novák, Jozef, 1951 Z5 (Author) Andok, Robert Z5 (Author) In Optik. -- ISSN 0030-4026. -- Vol. 234, (2021), art. no. 166572 [6] s. Subj. Headings ellipsometry GaP SEM Nanowires Language English Document kind RBX - článok z periodika Category ADC - Scientific titles in foreign carented magazines and noticed year-books Category (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu In databases CC: 000638105400003
WOS: 000638105400003
DOI: 10.1016/j.ijleo.2021.166572
SCOPUS: 2-s2.0-85101783615Year 2021 article
Number of the records: 1