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Physical security of deep learning on edge devices: Comprehensive evaluation of fault injection attack vectors
Title statement Physical security of deep learning on edge devices: Comprehensive evaluation of fault injection attack vectors / aut. Hou, X., Breier, J., Jap, D., Ma, L., Bhasin, S., Liu, Y. Main entry-name Hou, Xiaolu, 1- (Author) - FIIT Ústav počítačového inžinierstva a aplikovanej informatiky Another responsib. Breier, Jakub, 1986- (Author) Jap, Dirmanto Z6 (Author) Lei, Ma (Author) Z6 Bhasin, Shivam Z6 (Author) Liu, Yang (Author) Z6 In Microelectronics Reliability. -- ISSN 0026-2714. -- Vol. 120, (2021), art. no. 114116, s. 1-11 Language English Document kind RBX - článok z periodika Category ADC - Scientific titles in foreign carented magazines and noticed year-books Category (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu In databases CC: 000652343900009
WOS: 000652343900009
DOI: 10.1016/j.microrel.2021.114116
SCOPUS: 2-s2.0-85104295214Year 2021 
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Number of the records: 1