Number of the records: 1
Influence of SiON interlayer on the diamond/GaN heterostructures studied by Raman and SIMS measurements
Title statement Influence of SiON interlayer on the diamond/GaN heterostructures studied by Raman and SIMS measurements / aut. Tibor Izsák, Gabriel Vanko, Oleg Babčenko, Andrej Vincze, Marian Vojs, Bohumír Zaťko, Alexander Kromka Main entry-name Izsák, Tibor (Author) Another responsib. Vanko, Gabriel Z5 (Author) Babčenko, Oleg (Author) Vincze, Andrej, 1975- (Author) Vojs, Marian, 1979- Z2 (Author) - FEI Ústav elektroniky a fotoniky Zaťko, Bohumír (Author) Kromka, Alexander, 1971- (Author) In Materials Science and Engineering B. -- ISSN 0921-5107. -- Vol. 273, (2021), Art. no. 115434 [6] s. Subj. Headings polycrystalline diamond GaN Raman spectroscopy stress SIMS Language English URL https://www.sciencedirect.com/science/article/pii/S0921510721003913#! Document kind RBX - článok z periodika Category ADC - Scientific titles in foreign carented magazines and noticed year-books Category (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu In databases CC: 000702850700008
WOS: 000702850700008
DOI: 10.1016/j.mseb.2021.115434
SCOPUS: 2-s2.0-85114516498Year 2021 article
Number of the records: 1