Influence of SiON interlayer on the diamond/GaN heterostructures studied by Raman and SIMS measurements

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Title statement	Influence of SiON interlayer on the diamond/GaN heterostructures studied by Raman and SIMS measurements / aut. Tibor Izsák, Gabriel Vanko, Oleg Babčenko, Andrej Vincze, Marian Vojs, Bohumír Zaťko, Alexander Kromka
Main entry-name	Izsák, Tibor (Author)
Another responsib.	Vanko, Gabriel Z5 (Author)
	Babčenko, Oleg (Author)
	Vincze, Andrej, 1975- (Author)
	Vojs, Marian, 1979- Z2 (Author) - FEI Ústav elektroniky a fotoniky
	Zaťko, Bohumír (Author)
	Kromka, Alexander, 1971- (Author)
In	Materials Science and Engineering B. -- ISSN 0921-5107. -- Vol. 273, (2021), Art. no. 115434 [6] s.
Subj. Headings	polycrystalline diamond
	GaN
	Raman spectroscopy
	stress
	SIMS
Language	English
URL	https://www.sciencedirect.com/science/article/pii/S0921510721003913#!
Document kind	RBX - článok z periodika
Category	ADC - Scientific titles in foreign carented magazines and noticed year-books
Category (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
In databases
Year	2021

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Number of the records: 1