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EBIC analysis of semi-insulating GaN/Si-doped GaN-on-GaN test structures for vertical GaN transistors
Title statement EBIC analysis of semi-insulating GaN/Si-doped GaN-on-GaN test structures for vertical GaN transistors / aut. Juraj Priesol, Alexander Šatka, Aleš Chvála, Peter Šichman, Stanislav Hasenöhrl, Ján Kuzmík, František Uherek Main entry-name Priesol, Juraj, 1986- (Author) - FEI Ústav elektroniky a fotoniky Another responsib. Šatka, Alexander, 1960- Z1 (Author) - FEI Ústav elektroniky a fotoniky Chvála, Aleš, 1981- Z2 (Author) - FEI Ústav elektroniky a fotoniky Šichman, Peter (Author) Hasenöhrl, Stanislav Z5 (Author) Kuzmík, Ján (Author) Uherek, František, 1954- Z1 (Author) - FEI Ústav elektroniky a fotoniky In WOCSDICE‐EXMATEC 2022 / Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe. -- Aveiro : Universidade di Aveiro, 2022. -- S. OP 94-95 Language English Document kind RZB - článok zo zborníka Category BEE - Scientific works in not noticed year-books from international undertakings, foreign year-books Category (from 2022) O2 - Odborný výstup publikačnej činnosti ako časť knižnej publikácie alebo zborníka Type of document príspevok z podujatia Year 2022 
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Number of the records: 1