Automatic detection and counting of defects from cathodoluminescence maps of GaN layers

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Title statement	Automatic detection and counting of defects from cathodoluminescence maps of GaN layers / aut. Juraj Priesol, David Gellen, Alexander Šatka
Main entry-name	Priesol, Juraj, 1986- (Author) - FEI Ústav elektroniky a fotoniky
Another responsib.	Gellen, David, 1999- Z4 (Author) - FEI Fakulta elektrotechniky a informatiky
	Šatka, Alexander, 1960- Z1 (Author) - FEI Ústav elektroniky a fotoniky
In	MECO 2023 / Mediterranean Conference on Embedded Computing (MECO 2023). -- Piscataway : IEEE, 2023. -- ISBN 979-8-3503-2291-0. -- ISSN 2637-9511. -- [4] s.
Subj. Headings	object detection
	object counting
	2D FFT
	segmentation
	CLAHE
	watershed
	Cathodoluminescence
	GaN
	quality assessment
	reliability
Language	English
URL	https://ieeexplore.ieee.org/document/10155031
Document kind	RZB - článok zo zborníka
Category	AFC - Reports at international scientific conferences
Category (from 2022)	V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka
Type of document	príspevok z podujatia
Year	2023

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Number of the records: 1