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Estimation of Screened Plasma Resonance Frequencies of a Layered Semiconductor Using a Single Oblique Incidence Reflectance Spectrum
Title statement Estimation of Screened Plasma Resonance Frequencies of a Layered Semiconductor Using a Single Oblique Incidence Reflectance Spectrum Main entry-name Foltin, Ondrej, 1940- (Author) - FEI Katedra fyziky In Physica Status Solidi (A)-Applications and Materials Science. -- Vol. 204, No. 4 (2007), s.1158-1161 Subj. Headings šikmá zrkadlová odrazivosť plazmová rezonancia vrstenvatý polovodič Language English Document kind RBX - článok z periodika Category ADC - Scientific titles in foreign carented magazines and noticed year-books Category (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Year 2007 
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