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Analysis and Correction of Carrier Spilling Effect for Different Si Structures

  1. Title statementAnalysis and Correction of Carrier Spilling Effect for Different Si Structures
    Main entry-name Kuruc, Marián (Author)
    Another responsib. Hulényi, Ladislav, 1938- (Author) - FEI Katedra mikroelektroniky
    Kinder, Rudolf, 1940- (Author) - FEI Ústav elektroniky a fotoniky
    In Journal of Electrical Engineering. -- Vol. 59, No. 6 (2008), s.302-309
    LanguageEnglish
    Document kindRBX - článok z periodika
    CategoryADF - Scientific titles in home not carented magazines and other year-books
    Category (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Year2009
    article

    article

Number of the records: 1  

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