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Analysis and Correction of Carrier Spilling Effect for Different Si Structures
Title statement Analysis and Correction of Carrier Spilling Effect for Different Si Structures Main entry-name Kuruc, Marián (Author) Another responsib. Hulényi, Ladislav, 1938- (Author) - FEI Katedra mikroelektroniky Kinder, Rudolf, 1940- (Author) - FEI Ústav elektroniky a fotoniky In Journal of Electrical Engineering. -- Vol. 59, No. 6 (2008), s.302-309 Language English Document kind RBX - článok z periodika Category ADF - Scientific titles in home not carented magazines and other year-books Category (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Year 2009 article
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