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Effect of Annealing Temperature on Properties of TiO2/NiO Based Thin Films
Title statement Effect of Annealing Temperature on Properties of TiO2/NiO Based Thin Films Main entry-name Košč, Ivan, 1984- (Author) - FEI Ústav elektroniky a fotoniky Another responsib. Grieseler, R. (Author) Wilke, M. (Author) Predanocy, Martin, 1984- (Author) - FEI Ústav elektroniky a fotoniky Kups, Thomas (Author) Hotový, Ivan, 1957- (Author) - FEI Ústav elektroniky a fotoniky Řeháček, Vlastimil, 1957- (Author) - FEI Ústav elektroniky a fotoniky Spiess, Lothar (Author) In ELITECH´10 : 12th Conference of Doctoral Students. Bratislava, Slovak Republic, 26.5.2010. -- Bratislava : STU v Bratislave, 2010. -- ISBN 978-80-227-3303-8. -- s.CD-Rom Language English Document kind RZB - článok zo zborníka Category AFD - Reports at home scientific conferences Category (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Year 2010 
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Number of the records: 1