- Hierarchical test generation for combinational circuits with real def…
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Hierarchical test generation for combinational circuits with real defects coverage

  1. Title statementHierarchical test generation for combinational circuits with real defects coverage
    Main entry-name Cibáková, T. (Author)
    Another responsib. Fischerová, M. (Author)
    Gramatová, Elena, 1948- (Author) - FIIT Ústav počítačového inžinierstva a aplikovanej informatiky
    Kuzmicz, W. (Author)
    Pleskacz, W.A. (Author)
    Raik, J. (Author)
    Ubar, Raimund (Author)
    Translated titleHierarchické generovanie testov pre kombinančné obvody s pokrytím reálnych defektov
    In Microelectronics Reliability. -- Vol. 42, Iss. 7 (2002), s.1141-1149
    Subj. Headings defekty
    digitálny obvod
    generovanie testov
    LanguageEnglish
    Document kindRBX - článok z periodika
    CategoryADC - Scientific titles in foreign carented magazines and noticed year-books
    In databases
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