Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness

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	CREPC201502 CREPC201503 CREPC201506
Title statement	Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness
Main entry-name	Mikolášek, Miroslav, 1983- (Author) - FEI Ústav elektroniky a fotoniky
Another responsib.	Nemec, Michal, 1984- (Author) - FEI Ústav elektroniky a fotoniky
	Vojs, Marian, 1979- (Author) - FEI Ústav elektroniky a fotoniky
	Jakabovič, Ján, 1951- (Author) - FEI Ústav elektroniky a fotoniky
	Řeháček, Vlastimil, 1957- (Author) - FEI Ústav elektroniky a fotoniky
	Zhang, Dong (Author)
	Zeman, Miro (Author)
	Harmatha, Ladislav, 1948- (Author) - FEI Ústav elektroniky a fotoniky
In	Thin Solid Films. -- Vol. 558 (2014), s. 315-319
Language	English
Document kind	RBX - článok z periodika
Category	ADC - Scientific titles in foreign carented magazines and noticed year-books
Category (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Year	2014

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Number of the records: 1