Application of IDDT Test in SRAM Arrays Towards Detection of Weak Opens

Number of the records: 1

	CREPC201502 CREPC201503 CREPC201506
Title statement	Application of IDDT Test in SRAM Arrays Towards Detection of Weak Opens : dát. obhaj. 24.6.2014, č. ved. odb. 26-13-9
Main entry-name	Gyepes, Gábor, 1985- (Author) - FEI Ústav elektroniky a fotoniky
Another responsib.	Stopjaková, Viera, 1968- (Thesis advisor) - FEI Ústav elektroniky a fotoniky
Translated title	Aplikácia IDDT testu na pokrytie prerušení v SRAM poliach
Issue data	Bratislava : STU v Bratislave FEI, 2014
Faculty	FEI
Date of acceptation	24.06.2014
Degree program	99
Phys.des.	98 s AUTOREF. 2014, 36 s.
Subj. Headings	Mikroelektronika
	Microelectronics
Country	Slovakia
Language	English
URL	http://is.stuba.sk/zp/portal_zp.pl?podrobnosti=113990
Document kind	DDZ - dizertačná práca
Category	DAI - Qualificational works (thesis, habilitation, atestation...)
Year	2014

Barcode	Call number of location	Call number	Location	Sublocation	Info
284ED01446		E*ZP-310	Fakulta elektrotechniky a informatiky	Knižnica FEI

citace PRO

Number of the records: 1