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2000 IEEE International reliability physics symposium procedings

  1. Title statement2000 IEEE International reliability physics symposium procedings : 38th annual. San Jose, California, USA.10.- 13. April 2000
    Issue dataPiscataway : Institute of Electrical and Electronics Engineers, 2000
    Phys.des.455 s
    ISBN0-7803-5860-0
    Subj. Headings spoľahlivosť
    fyzika tuhých látok
    fyzika polovodičov
    polovodiče
    polovodičové súčiastky
    dielektriká
    UDC538.9
    621.315.592
    621.382
    519.718
    061.3(08)
    CountryUnited States
    LanguageEnglish
    Document kindAZN - zborník
    book

    book

    BarcodeCall number of locationCall numberLocationSublocationInfo
    284EZ00072E*Z-637Fakulta elektrotechniky a informatikyKnižnica FEIunavailable

Number of the records: 1  

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