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Analysis of the current transients by monitoring lateral current evolution in AlGaN/GaN structure

  1. CREPC201609 CREPC102016 CREPC201611 CREPC201701 CREPC201702 CREPC201703 CREPC201706
    Title statementAnalysis of the current transients by monitoring lateral current evolution in AlGaN/GaN structure / aut. Martin Florovič, Robert Szobolovszký, Jaroslav Kováč, Jaroslava Škriniarová, Peter Kordoš
    Main entry-name Florovič, Martin, 1978- (Author) - FEI Ústav elektroniky a fotoniky
    Another responsib. Szobolovszký, Robert, 1990- Z3 (Author) - FEI Ústav elektroniky a fotoniky
    Kováč, Jaroslav, 1947- Z1 (Author) - FEI Ústav elektroniky a fotoniky
    Škriniarová, Jaroslava, 1954- Z2 (Author) - FEI Ústav elektroniky a fotoniky
    Kordoš, Peter, 1939- Z8 (Author) - FEI Ústav elektroniky a fotoniky
    In ADEPT 2016 [263 s.] / International conference on advances in electronic and photonic technologies. -- Žilina : University of Žilina, 2016. -- ISBN 978-80-554-1226-9. -- S. 253-256
    Subj. Headings GaN
    AlGaN
    ohmic contacts
    current transients
    trapping/detrapping
    LanguageEnglish
    Document kindRZB - článok zo zborníka
    CategoryAFD - Reports at home scientific conferences
    Category (from 2022)V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka
    Year2016
    article

    article

Number of the records: 1  

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