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How to generate high quality tests for digital systems

Title statement	How to generate high quality tests for digital systems
Main entry-name	Ubar, R. (Author)
Another responsib.	Aarna, M. (Author)
	Kruus, H. (Author)
	Raik, J. (Author)
In	2004 International semiconductor conference : proceedings. 27th International Semiconductor Conference (CAS), Oct 04-06, 2004, Sinaia, Romania. -- [New York] : IEEE, 2004. -- ISBN 0-7803-8499-7. -- s.459-462
Language	English
Document kind	RZB - článok zo zborníka
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