Number of the records: 1  

Návrh prostriedkov pre automatizované testovanie integrovaných obvodov

  1. Title statementNávrh prostriedkov pre automatizované testovanie integrovaných obvodov
    Main entry-name Vu Viet, Hoang (Author) - FEI Ústav elektroniky a fotoniky
    Another responsib. Benko, Peter Z2 (Thesis advisor) - FEI Ústav elektroniky a fotoniky
    Translated titleDEVELOPMENT of APPLICATIONS for AUTOMATED TESTING of INTEGRATED CIRCUITS
    Issue data2018
    FacultyFEI
    Date of acceptation03.07.2018
    Degreee discipline5.2.13. elektronika
    Degree programB-ELN
    Phys.des.59 s., príl., CD-ROM
    Subj. HeadingsAutomated Testing
    Diode
    Integrated Circuit
    dióda
    integrovaný obvod
    automatizované testovanie
    CountrySlovakia
    LanguageSlovak
    URLhttp://is.stuba.sk/zp/portal_zp.pl?podrobnosti=124155
    Document kindDBP - bakalárska práca
    book

    book

    BarcodeCall number of locationCall numberLocationSublocationInfo
    284ER02579E*Bc- 2579Fakulta elektrotechniky a informatikyÚstav elektroniky a fotonikyIn-Library Use Only

Number of the records: 1  

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