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Characterization of monolithic InAlN/GaN NAND and NOR logic gates supported by circuit and device simulations
- Title statement - Characterization of monolithic InAlN/GaN NAND and NOR logic gates supported by circuit and device simulations / aut. Aleš Chvála - Main entry-name - Chvála, Aleš, 1981- (Author) - FEI Ústav elektroniky a fotoniky - Another responsib. - Nagy, Lukáš, 1985- Z2 (Author) - FEI Ústav elektroniky a fotoniky - Marek, Juraj, 1983- Z2 (Author) - FEI Ústav elektroniky a fotoniky - Priesol, Juraj, 1986- Z2 (Author) - FEI Ústav elektroniky a fotoniky - Donoval, Daniel, 1953- Z1 (Author) - FEI Ústav elektroniky a fotoniky - Blaho, Michal, 1982- (Author) - Gregušová, Dagmar (Author) - Kuzmík, Ján (Author) - Šatka, Alexander, 1960- Z1 (Author) - FEI Ústav elektroniky a fotoniky - In - WOCSDICE 2019 / Workshop on compound semiconductor devices and integrated circuits held in Europe (Wocsdice 2019). -- Cabourg, 2019. -- [2] s. - Language - English - Document kind - RZB - článok zo zborníka - Category - BEE - Scientific works in not noticed year-books from international undertakings, foreign year-books - Category (from 2022) - O2 - Odborný výstup publikačnej činnosti ako časť knižnej publikácie alebo zborníka - Year - 2019  - article 
Number of the records: 1