- Characterization of monolithic InAlN/GaN NAND and NOR logic gates sup…
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Characterization of monolithic InAlN/GaN NAND and NOR logic gates supported by circuit and device simulations

  1. Characterization of monolithic InAlN/GaN NAND and NOR logic gates supported by circuit and device simulations / aut. Aleš Chvála
    Chvála Aleš ; 033000  Nagy Lukáš ; 033000 Marek Juraj ; 033000 Priesol Juraj ; 033000 Donoval Daniel ; 033000 Blaho Michal Gregušová Dagmar Kuzmík Ján Šatka Alexander ; 033000
    WOCSDICE 2019 : . [2] s.
    článok zo zborníka
    BEE - Scientific works in not noticed year-books from international undertakings, foreign year-books
    O2 - Odborný výstup publikačnej činnosti ako časť knižnej publikácie alebo zborníka
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Number of the records: 1  

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