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Characterization of monolithic InAlN/GaN NAND and NOR logic gates supported by circuit and device simulations
- Characterization of monolithic InAlN/GaN NAND and NOR logic gates supported by circuit and device simulations / aut. Aleš Chvála
Chvála Aleš ; 033000 Nagy Lukáš ; 033000 Marek Juraj ; 033000 Priesol Juraj ; 033000 Donoval Daniel ; 033000 Blaho Michal Gregušová Dagmar Kuzmík Ján Šatka Alexander ; 033000
WOCSDICE 2019 : . [2] s.
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BEE - Scientific works in not noticed year-books from international undertakings, foreign year-books
O2 - Odborný výstup publikačnej činnosti ako časť knižnej publikácie alebo zborníkaarticle
Number of the records: 1