- Zr and Mo thin films with reduced residual impurities’ uptake under h…
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Zr and Mo thin films with reduced residual impurities’ uptake under highvacuum conditions at room temperature

  1. Title statementZr and Mo thin films with reduced residual impurities’ uptake under highvacuum conditions at room temperature / aut. Marcel Meško, Jana Bohovičová, Frans Munnik, Jörg Grenzer, René Hübner, Ľubomír Čaplovič, Mária Čaplovičová, Ľubomír Vančo, Viliam Vretenár, Matthias Krause
    Main entry-name Meško, Marcel, 1977- (Author) - MTF Ústav materiálov
    Another responsib. Bohovičová, Jana, 1986- Z2 (Author) - MTF Ústav materiálov
    Munnik, Frans (Author)
    Grenzer, Jörg (Author)
    Hübner, René (Author)
    Čaplovič, Ľubomír, 1955- Z1 (Author) - MTF Ústav materiálov
    Čaplovičová, Mária, 1957- Z2 (Author) - Centrum STU pre nanodiagnostiku
    Vančo, Ľubomír, 1983- Z2 (Author) - Centrum STU pre nanodiagnostiku
    Vretenár, Viliam, 1976- Z2 (Author) - Centrum STU pre nanodiagnostiku
    Krause, Matthias (Author)
    Noterok vykazovania by bol 2018, ale už je neskoro!!!
    In 16th International Conference on Plasma Surface Engineering [478 s.]. -- 2018. -- S. 1
    Subj. Headings refractory metallic thin films
    HiPIMS
    residual impurity
    LanguageEnglish
    Document kindRZB - článok zo zborníka
    CategoryBFA - Abstrakty odborných prác zo zahraničných podujatí (konferencie...)
    Category (from 2022)O2 - Odborný výstup publikačnej činnosti ako časť knižnej publikácie alebo zborníka
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