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Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes
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$2 DOI $a 10.1109/ASDAM55965.2022.9966747 024 7-
$2 IEEE $a 9966747 024 7-
$2 SCOPUS $a 2-s2.0-85144592792 035 $a biblio/1017290 $2 CREPC2 040 $a STU $b slo 041 0-
$a eng 100 1-
$7 stu_us_auth*stu80446 $a Priesol, Juraj, $d 1986- $u 033000 $4 aut $r Z2 $9 45 $U FEI Fakulta elektrotechniky a informatiky $T FEI Ústav elektroniky a fotoniky $X 28614 $U E030 $Y 549 245 10
$a Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes / $c aut. Juraj Priesol, Alexander Šatka, Matteo Borga, A Minj, Benoit Bakeroot, Karen Geens 700 1-
$7 stu_us_auth*stu9834 $a Šatka, Alexander, $d 1960- $u 033000 $r Z1 $4 aut $9 40 $U FEI Fakulta elektrotechniky a informatiky $T FEI Ústav elektroniky a fotoniky $X 1865 $U E030 $Y 549 700 1-
$7 stu_us_auth*0042579 $a Borga, Matteo $4 aut $9 3 700 1-
$7 stu_us_auth*stu125697 $a Minj, A. $4 aut $9 6 700 1-
$7 stu_us_auth*0041038 $a Bakeroot, Benoit $4 aut $9 3 700 1-
$7 stu_us_auth*0090193 $a Geens, Karen $4 aut $9 3 773 0-
$w stu_us_cat*0098022 $t ASDAM 2022 $b 1. ed.. $h 254 s. $z 978-1-6654-6977-7 $7 m2am $a International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM 2022) $d Danvers : IEEE, 2022 $g S. 83-87 856 4-
$u https://ieeexplore.ieee.org/document/9966747
Number of the records: 1