- Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes
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Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes

  1. Priesol, Juraj, 1986- Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes / aut. Juraj Priesol, Alexander Šatka, Matteo Borga, A Minj, Benoit Bakeroot, Karen Geens. -- 10.1109/ASDAM55965.2022.9966747. -- 9966747. -- 2-s2.0-85144592792. Šatka, Alexander, 1960-. Borga, Matteo. Minj, A.. Bakeroot, Benoit. Geens, Karen In: ASDAM 2022. -- 1. ed... -- 254 s.. -- 978-1-6654-6977-7 International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM 2022). -- Danvers : IEEE, 2022. -- S. 83-87.
Number of the records: 1  

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