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Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes
Title statement Cross-sectional SEM-EBIC analysis of semi-vertical GaN power diodes / aut. Juraj Priesol, Alexander Šatka, Matteo Borga, A Minj, Benoit Bakeroot, Karen Geens Main entry-name Priesol, Juraj, 1986- (Author) - FEI Ústav elektroniky a fotoniky Another responsib. Šatka, Alexander, 1960- Z1 (Author) - FEI Ústav elektroniky a fotoniky Borga, Matteo (Author) Minj, A. (Author) Bakeroot, Benoit (Author) Geens, Karen (Author) In ASDAM 2022 [254 s.] / International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM 2022). -- Danvers : IEEE, 2022. -- ISBN 978-1-6654-6977-7. -- S. 83-87 Language English Document kind RZB - článok zo zborníka Category AFD - Reports at home scientific conferences Category (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok z podujatia Year 2022 
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