1. Using Spreading Resistance Profiling and Simulations for Monitoring of Phosphorus Contamination in Ion Implantation of Arsenic
Title information : Using Spreading Resistance Profiling and Simulations for Monitoring of Phosphorus Contamination in Ion Implantation of Arsenic
Variant heading : \q12*stu_us_auth*1 stu58853 \q \q1013 stu_us_auth*stu58853 \d Kuruc Marián \q
%continue : \q12*stu_us_auth*1 stu4296 \q \q1013 stu_us_auth*stu4296 \d Hulényi Ladislav \q ; E210 \q12*stu_us_auth*1 stu8847 \q \q1013 stu_us_auth*stu8847 \d Kinder Rudolf \q ; E030
In : \q12**1 stu170841 \q
%continue : EDS´08. Electronic Devices and Systems IMAPS CS International Conference 2008 :
%continue : . s.103-108
Document kind : článok zo zborníka
Category : AFC - Reports at international scientific conferences
Category (from 2022) : V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka