Electronic structure mapping of branching states in poly[methyl(phenyl)silane] upon exposure to UV radiation / aut. František Schauer, Lukáš Tkáč, Miroslava Ožvoldová, Vojtech Nádaždy, Katarína Gmucová, Karol Végsö, Miroslava Tkáčová, Juraj Chlpík
Schauer František  Tkáč Lukáš Ožvoldová Miroslava Nádaždy Vojtech Gmucová Katarína Végsö Karol Tkáčová Miroslava Chlpík Juraj ; 036000
Journal of the Korean Physical Society . Vol. 68, Iss. 4 (2016), s. 563-568
branching states white photoluminescence energy-resolved electrochemical impedance spectroscopy density of electronic states organic semiconductors polysilane degradation information recording nanomasks production
https://www.researchgate.net/publication/296692792_Electronic_Structure_Mapping_of_Branching_States_in_Polymethylphenylsilane_Upon_Exposure_to_UV_Radiation
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