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Records found: 2  
Your query: Author Sysno = "^stu_us_auth 0090177^"

  1. 1.characterization, testing measurement, and metrology

    characterization, testing measurement, and metrology / aut. Chander Prakash, Sunpreet Singh, J. Paulo Davim
    Prakash Chander  Singh Sunpreet Davim J. Paulo
    Boca Raton (USA) CRC Press 2021 . - 192 s.
    ISBN 978-0-367-27515-0
    skúšanie meranie metrológia
    monografia
    Faculty Available Inaccesible Issued For Request Only
    MTF0100
    book

    book

  2. 2.Charackterization, Testing, Measurement, and Metrology

    Charackterization, Testing, Measurement, and Metrology / aut. Chander Prakash, Sunpreet Singh, J. Paulo Davim
    Prakash Chander  Singh Sunpreet Davim J. Paulo
    Boca Raton CRC Press 2021 . - 192 s.
    ISBN 978-0-367-27515-0
    metrológia
    monografia
    Faculty Available Inaccesible Issued For Request Only
    MTF0010
    book

    book



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