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Your query: Author Sysno = "^stu_us_auth 0091081^"
  1. Structural analysis of sputtered Sc(x)Al(1-x)N layers for sensor / aut. Bernd Hähnlein, Tim Hofmann, Katja Tonisch, Jörg Pezoldt, Jaroslav jr Kováč, Stefan Krischok
    Hähnlein Bernd  Hofmann Tim Tonisch Katja Pezoldt Jörg Kováč Jaroslav jr. ; 033000 Krischok Stefan
    Materials Science and Smart Materials : . S. 13-18
    scandium aluminum nitride XPS XRD FTIR Raman magnetoelectric sensor
    článok zo zborníka
    AFC - Reports at international scientific conferences
    V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka
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