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- Fundamental principles of engineering nanometrology
Leach Richard K.
Amsterdam : Elsevier, 2010 . - 321 s
ISBN 978-0-08-096454-6
mikrotechnológie nanotechnológie meracie prístroje metrológia meranie
monografiaFaculty Available Inaccesible Issued For Request Only MTF 0 0 1 0 
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