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- Investigating the effect of off-state stress on trap densities in AlGaN/GaN high electron mobility transistors
Liu L. Ren F. Pearton Stephen J. et al.
Journal of Vacuum Science and Technology B . Vol. 29, No. 6 (2011), s.Art.No.3660396
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- Zinc Oxide Bulk, Thin Films and Nanostructures : Processing, Properties and Applications / Ed.: Jagadish, Ch., Pearton, S.J.
Jagadish Chennupati (Editor) Pearton Stephen J. (Editor)
Oxford : Elsevier, 2006 . - 589 s
ISBN 0-0804-4722-8
nanoštruktúry molekulárne vlastnosti tenké vrstvy oxid zinka
monografiaFaculty Available Inaccesible Issued For Request Only FEI 0 0 0 1 
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