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  1. Faculty Available Inaccesible Issued For Request Only
    FEI0001
    book

    book

  2. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy / Ed.: Briggs, D., Grant, J.T.
    Briggs David (Compiler)  Grant John T. (Compiler)
    Chichester : IM Publications, 2003 . - 899 s
    ISBN 1-901019-04-7
    analýza povrchov augerova elektrónová spektroskopia röntgenová spektroskopia fotoelektrónová spektroskopia
    monografia
    Faculty Available Inaccesible Issued For Request Only
    FEI0001
    book

    book

  3. Scanning Electron Microscopy and X-Ray Microanalysis
    3rd Ed.
    New York : Springer Science-Business Media, 2003 . - 690 s
    ISBN 978-0-306-47292-3
    elektrónová mikroskopia materiálové inžinierstvo röntgenová spektroskopia mikroanalýza röntgenová
    monografia
    Faculty Available Inaccesible Issued For Request Only
    MTF0010
    book

    book

  4. X-ray analysers in process control / [aut.] Carr-Brion,Ken
    Carr-Brion Ken 
    1.vyd.
    London : Elsevier Applied Science, 1989 . - 161 s
    ISBN 1-85166-334-7
    röntgenová fluorescenčná analýza röntgenová analýza röntgenová spektroskopia röntgenografia náuka o materiáloch fyzika tuhých látok
    monografia
    Faculty Available Inaccesible Issued For Request Only
    FEI0001
    book

    book