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  1. Built-in Self-repair for a Processor Multiplier
    Kincel Andrej ; I100  Baláž Marcel (Thesis advisor)
    IIT.SRC 2014 : . s. 559-564
    článok zo zborníka
    AFD - Reports at home scientific conferences
    article

    article

  2. Delay faults testing chapter 17 / aut. Marcel Baláž, Roland Dobai, Elena Gramatová
    Baláž Marcel  Dobai Roland Gramatová Elena ; 070100
    Design and test technology for dependable systems-on-chip / . S. 378-394
    kapitola(článok) z dokumentu
    ABC - Chapters in scientific monography issued in foreign editorship
    article

    article

  3. Wrapper tool - learning and application of digital system testability to SoC cores
    Baláž Marcel  Bečková Jana Gramatová Elena ; I100
    SIBIRCON-2010 : . s.384-389
    digitálny obvod testovateľnosť systém na čipe
    článok zo zborníka
    AFC - Reports at international scientific conferences
    article

    article

  4. eTool for teaching and application of digital system testability techniques
    Baláž Marcel  Gramatová Elena ; I100 Fischerová Mária Pikula Tomáš
    EUROCON 2005. International conference on Computer as a Tool : . s.831-834
    digitálny systém testovateľnosť výučba
    článok zo zborníka
    AFC - Reports at international scientific conferences
    (1) - zborník (príspevkov)
    (1) - xjcp
    article

    article

  5. Contribution to digital system testing methods
    Baláž Marcel 
    Information Sciences and Technologies. Bulletin of the ACM Slovakia . s.16-23
    článok z periodika
    article

    article