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  1. 1.OTFT with Pentacene-Gate Dielectric Interface Modified by Silicon Nanoparticles

    OTFT with Pentacene-Gate Dielectric Interface Modified by Silicon Nanoparticles
    Jakabovič Ján ; E030  Kováč Jaroslav ; E030 Srnánek Rudolf ; E030 Weis Martin Sokolský Michal ; E060 Guldan Štefan ; E Broch K. Schreiber Frank Donoval Daniel ; E030 Cirák Július ; E060
    APCOM 2011. Applied Physics of Condensed Matter : . s.56-60
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  2. 2.In situ GISAXS monitoring of Langmuir nanoparticle multilayer degradation processes induced by UV photolysis

    In situ GISAXS monitoring of Langmuir nanoparticle multilayer degradation processes induced by UV photolysis / aut. Karol Végsö, Peter Šiffalovič, Martin Weis, Matej Jergel, Monika Benkovičová, Eva Majková, Livia Chitu, Yurily Halahovets, Stefan Luby, Ignác Capek, Alexander Šatka
    Végsö Karol  Šiffalovič Peter Weis Martin Jergel Matej Benkovičová Monika Majková Eva Chitu Livia Halahovets Yurily Luby Stefan Capek Ignác Šatka Alexander ; 033000
    Physica Status Solidi (A)-Applications and Materials Science . Vol. 208, Iss. 11 (2011), s. 2629-2634
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  3. 3.Effect of Trap Density on Carrier Propagation in Organic Field-Effect Transistors Investigated by Impedance Spectroscopy

    Effect of Trap Density on Carrier Propagation in Organic Field-Effect Transistors Investigated by Impedance Spectroscopy
    Li Jack  Weis Martin Taguchi Dai Manaka Takaaki Iwamoto Mitsumasa
    Japanese Journal of Applied Physics . Vol. 49 (2010), s.Art. No. 01AE14
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  4. 4.Pentacene-Gate Dielectric Interface Modification with Silicon Nanoparticles

    Pentacene-Gate Dielectric Interface Modification with Silicon Nanoparticles
    Jakabovič Ján ; E030  Kováč Jaroslav ; E030 Srnánek Rudolf ; E030 Weis Martin Sokolský Michal ; E060 Hinderhofer Alexander Broch K. Schreiber Frank Donoval Daniel ; E030 Cirák Július ; E060
    IVC - 18th International Vacuum Congress :
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  5. 5.Structural and Electronic Properties of Pentacene/Pentacenequinone Thin Films Prepared by Langmuir-Blodgett Technique

    Structural and Electronic Properties of Pentacene/Pentacenequinone Thin Films Prepared by Langmuir-Blodgett Technique
    Weis Martin ; E150  Gmucová Katarína Haško Daniel Müllerová Jarmila
    Collection of Czechoslovak Chemical Communications . Vol. 74, No. 4 (2009), s.565-579
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  6. 6.Effect of Calcium Ions on Molecular Interactions in Biomembranes

    Effect of Calcium Ions on Molecular Interactions in Biomembranes
    Sokolský Michal ; E060  Peterkeová D. Weis Martin Cirák Július ; E060
    APCOM 2009. Applied Physics of Condensed Matter : . s.140-143
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  7. 7.Fabrication and Characterization of Hybrid Tunnel Magnetoresistance Structures with Embedded Self-Assembled Nanoparticle Templates

    Fabrication and Characterization of Hybrid Tunnel Magnetoresistance Structures with Embedded Self-Assembled Nanoparticle Templates
    Siffalovič Peter  Majková Eva Chitu L. Halahovets Y. Jergel M. Senderák R. Luby Štefan Weis Martin ; E150 Šatka Alexander ; E030 Szymanski B. Stobiecki F. Timmann A. Rothe S. V.
    Acta Physica Polonica A . Vol. 115 (2009), s.332-335
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  8. 8.A Comparative Study of Hydrogen- and Hydroxyl-Related Pentacene Defect Formation in Thin Films Prepared by Langmuir-Blodgett Technique and Thermal Evaporation

    A Comparative Study of Hydrogen- and Hydroxyl-Related Pentacene Defect Formation in Thin Films Prepared by Langmuir-Blodgett Technique and Thermal Evaporation
    Gmucová Katarína  Weis Martin ; E150 della Pirriera Monica Puigdollers J.
    Physica Status Solidi (A)-Applications and Materials Science . Vol. 206 (2009), s.1404-1409
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  9. 9.Preparation and Properties of Thin Parylene Layers as the Gate Dielectrics for Organic Field Effect Transistors

    Preparation and Properties of Thin Parylene Layers as the Gate Dielectrics for Organic Field Effect Transistors
    Jakabovič Ján ; E030  Kováč Jaroslav ; E030 Weis Martin ; E150 Haško Daniel Srnánek Rudolf ; E030 Valent Peter ; E210 Resel Roland
    Microelectronics Journal . Vol. 40 (2009), s.595-597
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  10. 10.A Combined X-ray, Ellipsometry and Atomic Force Microscopy Study on Thin Parylene-C Films

    A Combined X-ray, Ellipsometry and Atomic Force Microscopy Study on Thin Parylene-C Films
    Flesch G.H.  Werzer Oliver Weis Martin ; E150 Jakabovič Ján ; E030 Kováč Jaroslav ; E030 Haško Daniel Jakopic G. Wondergem H.J. Resel Roland
    Physica Status Solidi (A)-Applications and Materials Science . Vol. 206 (2009), s.1727-1730
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