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Records found: 3  
Your query: Author Sysno/Doc.kind = "^stu_us_auth stus6183 azn^"
  1. 2000 IEEE International reliability physics symposium procedings : 38th annual. San Jose, California, USA.10.- 13. April 2000
    Piscataway : Institute of Electrical and Electronics Engineers, 2000 . - 455 s
    ISBN 0-7803-5860-0
    spoľahlivosť fyzika tuhých látok fyzika polovodičov polovodiče polovodičové súčiastky dielektriká
    zborník
    Faculty Available Inaccesible Issued For Request Only
    FEI0001
    book

    book

  2. 1999 IEEE international reliability physics symposium proceedings : 37th annual. San Diego, USA California. 23.- 25. March 1999
    Piscataway : Institute of Electrical and Electronics Engineers, 1999 . - 448 s
    ISBN 0-7803-5220-3
    spoľahlivosť fyzika tuhých látok fyzika polovodičov polovodiče polovodičové súčiastky dielektriká
    zborník
    Faculty Available Inaccesible Issued For Request Only
    FEI0100
    book

    book

  3. Dielectric materials, measurements and applications : Seveth international conference. University of Bath, UK. 23.- 26. Sep. 1996
    London : Institution of Electrical Engineers, 1996 . - 397 s
    ISBN 0-85296-670-9
    dielektriká meranie dielektrických veličín
    zborník
    Faculty Available Inaccesible Issued For Request Only
    FEI0001
    book

    book



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