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Analysis of Structural Defect States in Thin Films of Small-Molecular Organic Semiconductors Using Complex Impedance Data and DFT
- Gmucová, Katarína Analysis of Structural Defect States in Thin Films of Small-Molecular Organic Semiconductors Using Complex Impedance Data and DFT / aut. Katarína Gmucová, Martin Konôpka, Lucia Feriancová, Vojtech Nádaždy, Peter Bokes, Martin Putala. -- 10.1063/5.0187451. -- 2-s2.0-85184803628. Konôpka, Martin, 1971-. Feriancová, Lucia. Nádaždy, Vojtech, 1961-. Bokes, Peter, 1973-. Putala, Martin In: Sitek, Jozef. -- APCOM 2023. -- 978-0-7354-4805-6. -- Melville : AIP Publishing, 2024. -- AIP Conference Proceedings. -- Art. no. 020002 [8] s.
Počet záznamov: 1