Design and test technology for dependable systems-on-chip / ed. Raimund Ubar ; ed. Jaann Raik, Theodor Heinrich Vierhaus
Ubar Raimund (ed.)  Raik Jaann (ed.) Vierhaus Theodor Heinrich (ed.)
1. vyd.
Hershey IGI Global 2011 . - 550 s.
ISBN 978-1-60960-212-3
monografia
(2) - článok