Výsledky vyhľadávania

Nájdených záznamov: 15  
Váš dotaz: Akcia/Konferencia = "International microelectronics assembly and packaging society"

  1. 1.Derivation of exchange times for a model of trap-assisted tunnelling in GaN/AlGaN/GaN heterostructures

    RACKO, Juraj et al. Derivation of exchange times for a model of trap-assisted tunnelling in GaN/AlGaN/GaN heterostructures. In IMAPS flash conference 2019 : 5th International microelectronics assembly and packaging society. Brno, Czech Republic. October 24-25, 2019. Brno : University of Technology, 2019, S. 78-79. ISBN 978-80-214-5796-6. E*e-28/2020

  2. 2.Elimination of the leakage inductance of the primary winding of an impulse transformer for a contact-less temperature gauge

    KADLEČÍKOVÁ, Magdaléna et al. Elimination of the leakage inductance of the primary winding of an impulse transformer for a contact-less temperature gauge. In IMAPS flash conference 2019 : 5th International microelectronics assembly and packaging society. Brno, Czech Republic. October 24-25, 2019. Brno : University of Technology, 2019, S. 64-65. ISBN 978-80-214-5796-6. E*e-245/2019

  3. 3.IMAPS flash conference 2019

    IMAPS flash conference 2019 : 5th International microelectronics assembly and packaging society. Brno, Czech Republic. October 24-25, 2019. Brno : University of Technology, 2019. ISBN 978-80-214-5796-6.

  4. 4.Hybridization of natural inorganic materials by carbon nanotubes

    KADLEČÍKOVÁ, Magdaléna et al. Hybridization of natural inorganic materials by carbon nanotubes. In IMAPS flash conference 2018 : 4th International microelectronics assembly and packaging society. Brno, Czech Republic. October 25-26, 2018. Brno : University of Technology, 2018, S. 56-57. ISBN 978-80-214-5680-8. E*e-177/2018

  5. 5.IMAPS flash conference 2018

    IMAPS flash conference 2018 : 4th International microelectronics assembly and packaging society. Brno, Czech Republic. October 25-26, 2018. Brno : University of Technology, 2018. ISBN 978-80-214-5680-8.

  6. 6.Revised model of spontaneous and piezoelectric polarization in III-V semiconductors

    RACKO, Juraj et al. Revised model of spontaneous and piezoelectric polarization in III-V semiconductors. In IMAPS flash conference 2018 : 4th International microelectronics assembly and packaging society. Brno, Czech Republic. October 25-26, 2018. Brno : University of Technology, 2018, S. 58-59. ISBN 978-80-214-5680-8. E*e-178/2018

  7. 7.IMAPS flash conference 2017 [elektronický zdroj]

    IMAPS flash conference 2017 [elektronický zdroj] : 3rd International microelectronics assembly and packaging society. Brno, Czech Republic. November 9-10, 2017. Brno : University of Technology, 2017. ISBN 978-80-214-5535-1.

  8. 8.Raman spectroscopy used to assess the temperature and mechanical stress in thin films of microelectronic structures

    KADLEČÍKOVÁ, Magdaléna et al. Raman spectroscopy used to assess the temperature and mechanical stress in thin films of microelectronic structures. In IMAPS flash conference 2017 [elektronický zdroj] : 3rd International microelectronics assembly and packaging society. Brno, Czech Republic. November 9-10, 2017. Brno : University of Technology, 2017, USB, [2] s. ISBN 978-80-214-5535-1. E*303/UEF/2017

  9. 9.Temperature dependent current transport in very thin MOS heterostructure

    RACKO, Juraj et al. Temperature dependent current transport in very thin MOS heterostructure. In IMAPS flash conference 2017 [elektronický zdroj] : 3rd International microelectronics assembly and packaging society. Brno, Czech Republic. November 9-10, 2017. Brno : University of Technology, 2017, USB, [4] s. ISBN 978-80-214-5535-1. E*304/UEF/2017

  10. 10.Two types of active substrates with silver nanostructured surface for surface enhanced raman spectroscopy (SERS)

    KADLEČÍKOVÁ, Magdaléna et al. Two types of active substrates with silver nanostructured surface for surface enhanced raman spectroscopy (SERS). In IMAPS flash conference : 2nd International microelectronics assembly and packaging society. Brno, Czech Republic. November 3-4, 2016. Brno : University of Technology, 2016, S. 66-67. ISBN 978-80-214-5416-3. E*393/UEF/2016

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