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- Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis / aut. Patrik Echlin
Echlin Patrik
New York : Springer, 2009 . - 330 s.
ISBN 978-0-387-85730-5
elektrónová mikroskopia röntgenová mikroanalýza
príručkaFaculty Available Inaccesible Issued For Request Only MTF 0 0 1 0