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Your query: Author Sysno = "^stu_us_auth 0028509^"
  1. Chip-chrunk resistance tests / aut. David Maňas, Aleš Mizera, Miroslav Maňas, Pavel Stoklasek, Stanislav Sehnalek, Ivan Hudec
    Maňas David  Mizera Aleš Maňas Miroslav Stoklasek Pavel Sehnalek Stanislav Hudec Ivan ; 049370
    Tire technology international . Vol. 2017, iss. 4 (2017), s. 112-115
    článok zo zborníka
    ADE - Scientific titles in foreign not carented magazines and other year-books
    V3 - Vedecký výstup publikačnej činnosti z časopisu


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